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MicroElectronics Testing and Technology Obsolescence Program (METTOP)

Testing Services

Photograph of an EEPROM (Electrically Erasable Programmable Read-Only Memory) undergoing testing.

METTOP test development for characterization of an EEPROM. Courtesy of METTOP Lab.

DMSMS strategies relating to microcircuits include integrating new technologies into legacy equipment and maintaining a supply of qualified old stock (obsolete) components.

METTOP supports these efforts by providing screening and quality conformance inspections (QCI) according to established standards (MIL-STD 883, MIL-STD 750, MIL-PRF-38535, MIL-PRF 19500).

General Capabilities

METTOP provides services in the following test areas:

  • Test planning, facility scheduling, test conduct, analysis, and report generation

  • Assessment of radiation effects on new integrated circuit (IC) technologies

  • Assessment of radiation effects on old stock, emulated, or re-targeted ICs required to sustain existing military-aerospace legacy equipment

  • Up-screening of commercial-off-the-shelf (COTS) ICs to customer specifications

  • QCI electrical tests (MIL-STD 883, TM 5005 Group A, all subgroups)

  • Evaluation of new component reliability and security technologies such as device prognostics and anti-tamper techniques

  • Fast-track (go/no go) failure analysis in conjunction with the New Mexico Tech Materials and Metallurgical Engineering Department

Specialized Radiation Testing

METTOP and its team members provide turn-key radiation testing services including

  • Semiconductor Pre- and Post Characterization

  • Neutron Radiation Testing

  • Gamma Radiation Testing

  • Dose Rate Upset Testing

  • Flash X-ray Testing

  • Solar/Thermal Testing

  • Enhanced Low Dose Rate Sensitivity Testing

  • Single Event Effects Testing