MicroElectronics Testing and Technology Obsolescence Program (METTOP)

Test Resources

Photograph of a METTOP engineer examining test data from a memory device.

A METTOP engineer examines test data from a memory device. Courtesy of METTOP Lab.

METTOP’s test resources include a Credence® Sapphire S system with a 768+ pin capacity. This mixed signal test system is capable of testing advanced integrated circuit (IC) technologies at speeds of up to 1.6 GHz per pin.

The Sapphire system with engineering support is available on an hourly basis for customer tests (prototype verification, failure analysis, design validation). Other test systems with engineering support are also available to interested customers.

Electronic Test Equipment: Mainframe Testers

Credence® Sapphire Mainframe High Speed ATE Tester
Teradyne® Mixed Signal Tester #A575/A585

Benchtop/Lab Test Equipment

Acterna® Communications Signals Analyzer #FB-8000
Credence® Personal KALOS II Memory Tester #PK
Keithley® 2400 Series SourceMeters, and Picoammeters
JD Instruments® portable test system
Quick Circuit® #QC-7000 Printed Circuit Board Milling System
Remstar®/Megastar® Microelectronics Storage
RF spectrum/network analyzer up to 6GHz
RF sources up to 3.2GHz
Arbitrary waveform generators, data timing generator, digital oscilloscopes, curve tracers, logic analyzer, Precision Semiconductor Parameter Analyzer
Temptronic® ThermoSpot® #TP27D-1, and ThermoStream® #TP04310A-3C44-4
Miscellaneous power supplies, fixtures, chambers, and lab equipment