Test Resources
Test Resources

Test Resources


METTOP’s test resources include a Credence® Sapphire S system with a 768+ pin capacity. This mixed signal test system is capable of testing advanced integrated circuit (IC) technologies at speeds of up to 1.6 GHz per pin.

The Sapphire system with engineering support is available on an hourly basis for customer tests (prototype verification, failure analysis, design validation). Other test systems with engineering support are also available to interested customers.

Electronic Test Equipment: Mainframe Testers

Benchtop/Lab Test Equipment

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