Test Resources

METTOP’s test resources include a Credence® Sapphire S system with a 768+ pin capacity. This mixed signal test system is capable of testing advanced integrated circuit (IC) technologies at speeds of up to 1.6 GHz per pin.

The Sapphire system with engineering support is available on an hourly basis for customer tests (prototype verification, failure analysis, design validation). Other test systems with engineering support are also available to interested customers.

Electronic Test Equipment: Mainframe Testers

• Credence® Sapphire Mainframe High Speed ATE Tester

• Teradyne® Mixed Signal Tester #A575/A585

• Credence® Personal KALOS II Memory Tester #PK

Benchtop/Lab Test Equipment

• Acterna® Communications Signals Analyzer #FB-8000

• Agilent Technologies® Arbitrary Waveform Generator #33250A, Precision Semiconductor Parameter Analyzer #4156C, and Universal Test Fixture #16442B

• BK Precision® Digital IC Tester #575

• Keithley® 2400 Series SourceMeters, and Picoammeters

• Quick Circuit® #QC-7000 Printed Circuit Board Milling System

• Remstar®/Megastar® Microelectronics Storage

• Tektronix® Arbitrary Waveform Generator #AWG710B, Data Timing Generator #DTG5274, Digital Oscilloscopes #3054B and #3052B, Digital Sampling Oscilloscope #TDS8200, High Power Curve Tracer #371B, Logic Analyzer #TLA721, and Programmable Curve Tracer #370B

• Temptronic® ThermoSpot® #TP27D-1, and ThermoStream® #TP04310A-3C44-4

• Miscellaneous power supplies, fixtures, chambers, and lab equipment