About Us
About Us

About Us

The MicroElectronics Testing and Technology Obsolescence Program (METTOP) at New Mexico Tech has been developed to address the challenges faced by customers whose systems are impacted by DMSMS.

METTOP’s technical abilities and testing facilities provide cost effective testing of advanced microcircuits for a variety of customers with diverse technical interests. Our specialty is evaluating the effects of nuclear and space radiation on memory devices.


METTOP provides test planning, facility scheduling, test conduct, analysis, and report generation services as a full-service test house. In association with other test facilities in the Rio Grande corridor (White Sands Missile Range, Sandia National Laboratories, Air Force Research Laboratory), METTOP provides a full complement of radiation testing services.

At the METTOP facility, test and research engineers operate state-of-the-art electronic test equipment including two mainframe mixed-signal testers that can characterize parts with up to 768 pins. In conjunction with the New Mexico Tech Electrical Engineering and Materials and Metallurgical Engineering departments, METTOP can provide a wide range of services including environmental testing, scanning electron microscopy, and materials analysis of semiconductor devices.

Emphasis on Education

A goal of the METTOP team is to further the educational experiences of New Mexico Tech students. We encourage our team members, customers and surrounding technical community to participate in mentoring and academic programs.

Copyright © 2005-2009 New Mexico Tech/EMRTC/METTOP All Rights Reserved.