MicroElectronics Testing and Technology Obsolescence Program (METTOP)

Meeting Today’s Challenges With Tomorrow’s Solutions

The MicroElectronics Testing and Technology Obsolescence Program (METTOP) state-of-the-art Microelectronics Semiconductor Testing and Design Center is a division of the Energetic Materials Research and Testing Center (EMRTC) at the New Mexico Institute of Mining and Technology (New Mexico Tech) in Socorro, New Mexico.

METTOP provides cost-effective means to manage issues of diminishing manufacturing sources and material shortages, or DMSMS.

METTOP’s mission is to test, evaluate and assess the wide range of microelectronic components that comprise so many of today’s sophisticated military, space and commercial systems.